• DocumentCode
    2959124
  • Title

    Effect of breaking high voltage direct current (HVDC) circuit on demonstrative project on power supply systems by service level in Sendai

  • Author

    Yamato, Naoaki ; Fukui, Akiyoshi ; Hirose, Keiichi

  • Author_Institution
    NTT Facilities, Tokyo
  • fYear
    2007
  • fDate
    Sept. 30 2007-Oct. 4 2007
  • Firstpage
    46
  • Lastpage
    51
  • Abstract
    A high voltage direct current (HVDC) system (300 V) was used for a demonstrative project on power supply systems by service level in Sendai, Japan, entrusted by the New Energy and Industrial Technology Development Organization (NEDO). In high-quality DC power systems, the existing DC protection devices, such as the fuse and the Molded Case Circuit Breaker (MCCB), cannot conduct quick and stable circuit breaking. Therefore, we developed a semiconductor switch that uses a metal oxide semiconductor-field effect transistor (MOS-FET) as a new DC protection device. However, although it is possible to quickly break a HVDC circuit using this semiconductor switch, the possibility of a malfunction still exists because the semiconductor switch is an active device. Therefore, we included a retry function that repeats the turn on and turn off of the MOS-FET at certain periods, thus devising a method of evading malfunctions. We present the characteristics for breaking a HVDC circuit when a semiconductor switch is used as the HVDC protective device in the demonstrative project on power supply systems by service level.
  • Keywords
    HVDC power convertors; circuit breakers; field effect transistor switches; power distribution protection; DC power systems; DC protection device; HVDC circuit; MOSFET; New Energy and Industrial Technology Development Organization; Sendai Service Level; fuse; high voltage direct current circuit; metal oxide semiconductor-field effect transistor; molded case circuit breaker; power supply systems; semiconductor switch; Circuit breakers; Electricity supply industry; Fuses; HVDC transmission; Industrial power systems; Power semiconductor switches; Power supplies; Power system protection; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 2007. INTELEC 2007. 29th International
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-1627-1
  • Electronic_ISBN
    978-1-4244-1628-8
  • Type

    conf

  • DOI
    10.1109/INTLEC.2007.4448735
  • Filename
    4448735