DocumentCode :
2959574
Title :
Wetting performance vs. board finish and flux for several Pb-free solder alloys
Author :
Sattiraju, S.V. ; Johnson, R.W. ; Genc, D.Z. ; Bozack, M.J.
Author_Institution :
NSF Center for Adv. Vehicle Electron., Auburn Univ., AL, USA
fYear :
2000
fDate :
2000
Firstpage :
253
Lastpage :
262
Abstract :
The move to replace lead in electronic assemblies is rapidly gaining momentum. The driving factors are potential legislation, primarily in Europe, and global market pressures for more environmentally friendly products. This work examines the compatibility of lead free solders and printed wiring board (PWB) finishes. The solder alloys evaluated were Sn-3.5Ag-1.5In, Sn-3.4Ag-4.8Bi, Sn-3.8Ag-0.7Cu, Sn-3.5Ag and Sn-0.7Cu. The PWB surface finishes were Sn, Ag, Pd, Ni/Au and OSP. Eutectic Sn-37Pb solder was used for baseline comparisons. Surface finishes “as received” and after one reflow cycle in nitrogen with a peak temperature of 260°C were studied. Double-sided reflow is common and the ability of the finish to survive at least one reflow cycle prior to assembly is critical. The surface finishes (as-received and after one reflow cycle) were characterized by Rutherford backscattering (RBS), Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). Wetting balance measurements were used to quantify solder wetting of each finish and alloy. Both a no-clean and a water soluble flux were used in the wetting balance tests
Keywords :
Auger electron spectra; Rutherford backscattering; X-ray photoelectron spectra; assembling; bismuth alloys; copper alloys; environmental factors; indium alloys; printed circuit manufacture; printed circuit testing; reflow soldering; silver alloys; surface treatment; tin alloys; wetting; 260 C; AES; Ag; Ag PWB surface finish; Auger electron spectroscopy; N2; Ni-Au; Ni/Au PWB surface finish; OSP PWB surface finish; PWB finishes; Pb-free solder alloys; Pd; Pd PWB surface finish; RBS; Rutherford backscattering; Sn; Sn PWB surface finish; Sn-Ag solder; Sn-Ag-Bi solder; Sn-Ag-Cu solder; Sn-Ag-In solder; Sn-Cu solder; SnAg; SnAgBi; SnAgCu; SnAgIn; SnCu; SnPb; X-ray photoelectron spectroscopy; XPS; board finish; double-sided reflow; electronic assemblies; environmentally friendly products; eutectic Sn-Pb solder; finish reflow cycle survival; global market pressure; lead free solders; lead replacement; legislation; nitrogen reflow atmosphere; no-clean flux; peak temperature; printed wiring board; reflow cycle; solder flux; solder wetting; water soluble flux; wetting balance measurements; wetting balance tests; wetting performance; Assembly; Consumer electronics; Environmentally friendly manufacturing techniques; Europe; Globalization; Lead; Legislation; Spectroscopy; Surface finishing; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location :
Santa Clara, CA
ISSN :
1089-8190
Print_ISBN :
0-7803-6482-1
Type :
conf
DOI :
10.1109/IEMT.2000.910735
Filename :
910735
Link To Document :
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