DocumentCode :
2959696
Title :
High reliability LTCC BGA for telecom applications
Author :
Prabhu, A. ; Schaefer, WJ ; Patil, S.
Author_Institution :
Package Technol. Group, Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
311
Lastpage :
323
Abstract :
The trend in the telecommunications industry is towards the usage of smaller packaging options while improving electrical and reliability performance. National Semiconductor, a producer of low temperature cofired ceramics (LTCC) and wireless components, strives to integrate these products into small, high performance modules. In particular, the module under development requires an LTCC substrate with ball grid array (BGA) ball attachment technique. This paper describes a series of experiments focused on materials selection required to produce high performance solder joints. Further evaluations were also performed to determine the printed circuit board (PCB) level reliability during thermal cycle life evaluation. This study evaluated commercially available LTCC pad metallizations and solder alloys, while also comparing several pad construction methods as a function of thermal cycle life. The results identify the key factors for material selection, which produced the maximum thermal cycle life for the LTCC BGA module
Keywords :
assembling; ball grid arrays; ceramic packaging; circuit reliability; integrated circuit interconnections; integrated circuit packaging; life testing; modules; printed circuit testing; soldering; telecommunication equipment testing; thermal stresses; BGA ball attachment technique; LTCC; LTCC BGA; LTCC BGA module; LTCC pad metallization; LTCC substrate; PCB level reliability; ball grid array; electrical performance; high performance modules; low temperature cofired ceramics; material selection; materials selection; maximum thermal cycle life; packaging size; pad construction methods; printed circuit board; reliability; reliability performance; solder alloys; solder joints; telecom applications; telecommunications industry; thermal cycle life; thermal cycle life evaluation; wireless components; Ceramics; Communication industry; Electrical products industry; Electronics packaging; Joining materials; Semiconductor device packaging; Semiconductor materials; Substrates; Telecommunications; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location :
Santa Clara, CA
ISSN :
1089-8190
Print_ISBN :
0-7803-6482-1
Type :
conf
DOI :
10.1109/IEMT.2000.910743
Filename :
910743
Link To Document :
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