Title :
Line scratches detection and restoration via light diffraction
Author :
Bruni, V. ; Vitulano, D. ; Kokaram, A.
Author_Institution :
Inst. per le Applicazioni del Calcolo, CNR, Rome, Italy
Abstract :
This paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.
Keywords :
image restoration; light diffraction; optical images; digital film sequences; light diffraction; line scratches detection; line scratches restoration; Brightness; Charge coupled devices; Degradation; Diffraction; Digital images; Educational institutions; Image restoration; Optical arrays; Parameter estimation; Proposals;
Conference_Titel :
Image and Signal Processing and Analysis, 2003. ISPA 2003. Proceedings of the 3rd International Symposium on
Print_ISBN :
953-184-061-X
DOI :
10.1109/ISPA.2003.1296858
