Title :
Open set classification using tolerance intervals
Author :
Real, Edward C. ; Baumann, Andrew H.
Author_Institution :
Signal Process. Technol. Directorate, Sanders Associates Inc., Nashua, NH, USA
fDate :
Oct. 29 2000-Nov. 1 2000
Abstract :
This paper presents a classification methodology that addresses the problem of open set classification. For our purposes here, we define open set classification as classification of data from signal classes that were not part of the training set data (the closed set). Classifiers that are not designed to account for this eventuality will often attempt to assign the received signal to one of the training set classes, potentially resulting in misclassification. We propose a method for overcoming this problem, based on tolerance interval analysis, that may be efficiently implemented in ASICs or FPGAs. In addition, our method leads naturally to a "probabilistic maximum level of significance" interpretation of type I errors for those signals that are falsely rejected from one of the training set classes.
Keywords :
error analysis; probability; signal classification; ASIC; FPGA; misclassification; multivariate data; nonstationary data; open set classification; probabilistic maximum level of significance; received signal; signal classes; tolerance extension tree classifiers; tolerance interval analysis; training set class; type I errors; univariate data; Application specific integrated circuits; Field programmable gate arrays; Logic; Materials science and technology; Mathematics; Random variables; Signal design; Signal processing; Training data; USA Councils;
Conference_Titel :
Signals, Systems and Computers, 2000. Conference Record of the Thirty-Fourth Asilomar Conference on
Conference_Location :
Pacific Grove, CA, USA
Print_ISBN :
0-7803-6514-3
DOI :
10.1109/ACSSC.2000.910757