Title :
Estimation and bounding of energy consumption in burst-mode control circuits
Author :
Beerel, P.A. ; Yun, K.Y. ; Nowick, S.M. ; Yeh, P.-C.
Author_Institution :
Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
This paper describes two techniques to quantify energy consumption of burst-mode asynchronous (clock-less) control circuits. The circuit specifications considered are extended burst-mode specifications, and the implementations are multi-level logic implementations whose outputs are guaranteed to be free of any voltage glitches (hazards). Both techniques use stochastic analysis to combine a small number of simulations in order to quantify average energy per external signal transition. The first technique uses N-valued simulation to derive mathematically tight upper and lower bounds of energy consumption. Using this technique we bound the effect of hazards under all possible operating conditions and environments for a given circuit. Additionally, to drive synthesis tools for low-power we propose a second technique that uses fixed-delay simulation to derive a realistic estimate of energy consumption within our derived upper and lower bounds. We demonstrate the feasibility of both these techniques on a variety of burst-mode control circuits used in an industrial-quality chip. Our preliminary results indicate that less than 5% of the power of typical multi-level burst-mode circuits can be attributed to hazards.
Keywords :
asynchronous circuits; circuit analysis computing; multivalued logic; N-valued simulation; burst-mode control circuits; circuit specifications; energy consumption bounding; energy consumption estimation; extended burst-mode specifications; multi-level logic implementations; stochastic analysis; synthesis tools; voltage glitches; Analytical models; Circuit simulation; Circuit synthesis; Clocks; Energy consumption; Hazards; Logic circuits; Signal analysis; Stochastic processes; Voltage;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.479881