DocumentCode :
2960214
Title :
Chip-level thermal simulator to predict VLSI chip temperature
Author :
Cheng, Yi-Kan ; Kang, Sung-Mo
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Volume :
2
fYear :
1995
fDate :
30 Apr-3 May 1995
Firstpage :
1392
Abstract :
In this paper, a new thermal simulator is developed to predict the steady-state and transient temperatures inside a VLSI chip subjected to heating by single or multiple heat sources. It uses a mixed 3D finite-difference and 1D analogous thermal circuit method, taking into account any combination of boundary conditions, shape of heat sources, and packaging. An analytical method is also presented and compared to the numerical method. With this tool, the chip temperature can be predicted accurately to provide design guidelines for VLSI module placement and chip packaging
Keywords :
VLSI; circuit analysis computing; finite difference methods; integrated circuit modelling; integrated circuit packaging; temperature distribution; thermal analysis; 1D analogous thermal circuit method; 3D finite-difference method; VLSI chip temperature prediction; analytical method; chip packaging; chip-level thermal simulator; module placement; multiple heat sources; numerical method; single heat source; steady-state temperature; transient temperature; Boundary conditions; Circuit simulation; Finite difference methods; Heating; Packaging; Predictive models; Shape; Steady-state; Temperature; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
Type :
conf
DOI :
10.1109/ISCAS.1995.520407
Filename :
520407
Link To Document :
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