DocumentCode
2960229
Title
Analysis of the intermodulation distortion and nonlinearity of common-base SiGeC HBTs.
Author
Guillot, Farah ; Garcia, Patrice ; Mouis, Mireille ; Belot, Didier
Author_Institution
IMEP, Grenoble
fYear
2006
fDate
10-13 Dec. 2006
Firstpage
664
Lastpage
667
Abstract
The aim of this paper is to study the nonlinearities of a common base RF transistor in order to identify the intrinsic origin of distortion. In this paper we introduce the Volterra theory through the CMNA (Compacted Modified Nodal Analysis) method to establish the output nonlinearities of the building block as a function of the transistor equivalent circuit elements. This method was applied to 0.25 mum SiGeC BiCMOS technologies for comparison purpose. The 2nd and 3rd nonlinear orders of the intermodulation output current were derived. The full expression was used to identify the dominant contributors of the nonlinearity and to provide a simplified expression. The role of the current-gain linearity and the difference between the high and low frequency performances were explained.
Keywords
BiCMOS integrated circuits; Ge-Si alloys; Volterra series; heterojunction bipolar transistors; intermodulation distortion; BiCMOS; SiGeC; Volterra theory; common base HBT; common base RF transistor; common-base SiGeC HBTs; compacted modified nodal analysis; intermodulation distortion; size 0.25 micron; transistor equivalent circuit elements; Equivalent circuits; Intermodulation distortion; Linearity; Nonlinear distortion; RF signals; Radio frequency; Radiofrequency identification; Research and development; Transconductance; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location
Nice
Print_ISBN
1-4244-0395-2
Electronic_ISBN
1-4244-0395-2
Type
conf
DOI
10.1109/ICECS.2006.379876
Filename
4263454
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