• DocumentCode
    2960344
  • Title

    Testing QCA Modular Logic

  • Author

    Sultana, Sayeeda ; Al Imam, Shahriar ; Radecka, Katarzyna

  • Author_Institution
    Concordia Univ., Montreal
  • fYear
    2006
  • fDate
    10-13 Dec. 2006
  • Firstpage
    700
  • Lastpage
    703
  • Abstract
    We propose a design for testability of arbitrary combinational quantum dot cellular automata (QCA) logic, which facilitates its functionality testing. Any combinational logic can be implemented using only AND-OR gates (with negated signals available), and in QCA this results in reduced test set. Previously this strategy was proposed for QCA testing considering only primary inputs (either true or complemented, but not both) feeding different majority voters, which fails for general circuits where fan-outs are allowed for primary inputs and their complement. In this paper we propose a design scheme that enables testing of any combinational QCA circuit.
  • Keywords
    cellular automata; combinational circuits; design for testability; logic gates; logic testing; quantum dots; AND-OR gates; arbitrary combinational QCA modular logic; design-for-testability; quantum dot cellular automata testing; CMOS technology; Circuit testing; Design for testability; Electrons; Inverters; Logic design; Logic devices; Logic testing; Quantum cellular automata; Quantum dots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    1-4244-0395-2
  • Electronic_ISBN
    1-4244-0395-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2006.379885
  • Filename
    4263463