DocumentCode
2960344
Title
Testing QCA Modular Logic
Author
Sultana, Sayeeda ; Al Imam, Shahriar ; Radecka, Katarzyna
Author_Institution
Concordia Univ., Montreal
fYear
2006
fDate
10-13 Dec. 2006
Firstpage
700
Lastpage
703
Abstract
We propose a design for testability of arbitrary combinational quantum dot cellular automata (QCA) logic, which facilitates its functionality testing. Any combinational logic can be implemented using only AND-OR gates (with negated signals available), and in QCA this results in reduced test set. Previously this strategy was proposed for QCA testing considering only primary inputs (either true or complemented, but not both) feeding different majority voters, which fails for general circuits where fan-outs are allowed for primary inputs and their complement. In this paper we propose a design scheme that enables testing of any combinational QCA circuit.
Keywords
cellular automata; combinational circuits; design for testability; logic gates; logic testing; quantum dots; AND-OR gates; arbitrary combinational QCA modular logic; design-for-testability; quantum dot cellular automata testing; CMOS technology; Circuit testing; Design for testability; Electrons; Inverters; Logic design; Logic devices; Logic testing; Quantum cellular automata; Quantum dots;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location
Nice
Print_ISBN
1-4244-0395-2
Electronic_ISBN
1-4244-0395-2
Type
conf
DOI
10.1109/ICECS.2006.379885
Filename
4263463
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