Title :
SWAT: An unsupervised SNN training algorithm for classification problems
Author :
Wade, John J. ; McDaid, Liam J. ; Santos, Jose A. ; Sayers, Heather M.
Author_Institution :
Syst. Res. Centre, Univ. of Ulster, Derry
Abstract :
The work presented in this paper merges the Bienenstock-Cooper-Munro (BCM) learning rule with spike timing dependent plasticity (STDP) to develop a training algorithm for a spiking neural network (SNN), stimulated using spike trains. The BCM rule is utilised to modulate the height of the plasticity window, associated with STDP. The SNN topology uses a single training neuron in the training phase where all classes are passed to this neuron, and the associated weights are subsequently mapped to the classifying output neurons: the weights are proportionally distributed across the output neurons to reflect similarities in the input data. The training algorithm also includes both exhibitory and inhibitory facilitating dynamic synapses that create a frequency routing capability allowing the information presented to the network to be routed to different hidden layer neurons. A variable neuron threshold level simulates the refractory period. The network is benchmarked against the non-linearly separable IRIS data set problem and results presented in the paper show that the proposed training algorithm exhibits a convergence accuracy comparable to other SNN training algorithms.
Keywords :
neural nets; unsupervised learning; Bienenstock-Cooper-Munro learning rule; IRIS data set problem; SWAT; classification problems; hidden layer neurons; inhibitory facilitating dynamic synapses; spike timing dependent plasticity; spiking neural network; training algorithm; unsupervised SNN training algorithm; Biological neural networks; Classification algorithms; Computer networks; Inhibitors; Intelligent systems; Iris; Network topology; Neurons; Reactive power; Timing;
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4634169