• DocumentCode
    2960877
  • Title

    Analysis of the Validity of E-assessment and Self-Assessment in Formal Assessment in Electrical and Electronics Engineering Studies through a Case Study

  • Author

    De Sande, Juan Carlos G ; Godino-Llorente, Juan Ignacio ; Osma-Ruíz, Víctor ; S´enz-Lechon, N.

  • Author_Institution
    Circuits & Syst. Eng. Dept., Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2012
  • fDate
    4-6 July 2012
  • Firstpage
    31
  • Lastpage
    35
  • Abstract
    A case study about the validity of e-assessment and self-assessment in Electrical and Electronics Engineering studies is presented. The results show that the students are able to assess and grade their own work in a quite similar way than instructors do: high correlation coefficients, low differences between their marks and the instructors´ marks comparable to those found among different instructors, no statistically different means and standard deviations, and comparable effect sizes with respect to those found among instructors. However, a relatively large number of students took advantage of the process and over marked their work. This group of students obtained surprisingly high scores in a series of e-assessed tests delivered by a learning management system. So an additional control is necessary to avoid this unfair behavior.
  • Keywords
    computer aided instruction; electronic engineering computing; electronic engineering education; correlation coefficients; e-assessment; electrical engineering studies; electronics engineering studies; formal assessment; learning management system; means deviations; self-assessment; standard deviations; student mark-instructor mark low difference; Analysis of variance; Correlation; Education; Europe; Process control; Reliability; Standards; Engineering Education; e-assessment; self-assessment validity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Learning Technologies (ICALT), 2012 IEEE 12th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4673-1642-2
  • Type

    conf

  • DOI
    10.1109/ICALT.2012.122
  • Filename
    6268027