• DocumentCode
    2960967
  • Title

    A Study of Software Fault Detection and Correction Process Models

  • Author

    Wu, Y.P. ; Hu, Q.P. ; Ng, S.H.

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore
  • Volume
    2
  • fYear
    2006
  • fDate
    21-23 June 2006
  • Firstpage
    812
  • Lastpage
    816
  • Abstract
    Most of the models for software reliability analysis are based on reliability growth models which deal with the fault detection process only. In this paper, some useful approaches to the modeling of both software fault detection and fault correction processes are discussed. To provide accurate predictions for correct decision-makings, parameters estimation method is critical. Specifically, a new explicit formula for the likelihood function of the combined fault detection and correction process is derived and the maximum likelihood estimates are obtained under various time delay assumptions. As an illustration, actual dataset from a software development project is analyzed. In addition, cost models are discussed in the context of this modeling framework on fault detection and correction. The corresponding effects on optimal release time are analyzed comprehensively. Also, potential benefits of this model on other aspects of software testing management are discussed
  • Keywords
    maximum likelihood estimation; program testing; software cost estimation; software fault tolerance; decision-making; maximum likelihood estimation; parameter estimation method; reliability growth model; software cost model; software development project analysis; software fault correction process model; software fault detection process model; software optimal release time; software reliability analysis; software testing management; Context modeling; Decision making; Delay effects; Delay estimation; Fault detection; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Programming; Software reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Innovation and Technology, 2006 IEEE International Conference on
  • Conference_Location
    Singapore, China
  • Print_ISBN
    1-4244-0147-X
  • Electronic_ISBN
    1-4244-0148-8
  • Type

    conf

  • DOI
    10.1109/ICMIT.2006.262333
  • Filename
    4037131