Title :
Throughput sensitivity analysis using a single simulation
Author :
Roser, Christoph ; Nakano, Masaru ; Tanaka, Minoru
Author_Institution :
Software Sci. Lab., Toyota Central R&D Labs. Inc., Aichi, Japan
Abstract :
This paper describes a novel method for calculating the sensitivity of the manufacturing system throughput to the variables of the machines. The sensitivity analysis needs only a single simulation, yet is easy to use and provides accurate results. This sensitivity analysis is then used to predict the change in the system throughput due to a change of the variables of the machines provided that the system change does not significantly change the bottleneck. These predictions can be used for a local optimization, allowing the use of a steepest descent optimization algorithm. The method is based on improving the momentary shifting bottlenecks. The shifting bottlenecks are detected using the shifting bottleneck detection method based on the active duration, i.e., the time a machine is active without interruption. The method is easy to understand and easy to implement in existing simulation software.
Keywords :
discrete event simulation; manufacturing data processing; manufacturing resources planning; optimisation; sensitivity analysis; change prediction; local optimization; machine active duration; machine variables; manufacturing system; shifting bottleneck detection; single simulation; steepest descent optimization algorithm; throughput sensitivity analysis; Analytical models; Change detection algorithms; Laboratories; Manufacturing systems; Optimization methods; Production systems; Research and development; Sensitivity analysis; Throughput; Time measurement;
Conference_Titel :
Simulation Conference, 2002. Proceedings of the Winter
Print_ISBN :
0-7803-7614-5
DOI :
10.1109/WSC.2002.1166361