Title :
A Novel Production System for Wide-Variety-Small-Volume Production - Modular Structure and Production Platform Hierarchy
Author :
KAMODA, Hiroki ; HOTTA, Tadaaki ; Nakatsuka, Nobuo ; Sugawa, Shigetoshi
Author_Institution :
Omron Corp., Kyoto
Abstract :
A novel production system for wide-variety-small-volume production is proposed. This system is composed of hierarchized three production platforms according to the purpose of quality, cost and delivery. "Function-quality conclusion production platform" enabled products to be completely produced without throwing defects into the post-process by in-line and in-process inspections. "Diverse-synchronized production platform" enabled products to be mix-produced without cost improving by united cycle-time between each process. "Demand-synchronized production platform" achieved the production that synchronized with order information without inventory of products. These platforms were able to be achieved by being able to divide integral products into modules that were difficult to modulate so far. Systematic improvement activities of production lines have been achieved by production platform hierarchy and clarification of role and concept of each production platform. The effect of this production system has been verified in the field of industrial control components
Keywords :
cellular manufacturing; cost reduction; industrial control; inspection; mechanical products; production control; quality management; cellular manufacturing; cycle time; demand-synchronized production platform; diverse-synchronized production platform; in-line inspection; in-process inspection; industrial control components; integral product inventory; operating cost reduction; production lines; quality production system; wide-variety-small-volume production; Acceleration; Cellular manufacturing; Cost function; Industrial control; Inspection; Manufacturing processes; Microcomputers; Process control; Production systems; Virtual manufacturing;
Conference_Titel :
Management of Innovation and Technology, 2006 IEEE International Conference on
Conference_Location :
Singapore, China
Print_ISBN :
1-4244-0147-X
Electronic_ISBN :
1-4244-0148-8
DOI :
10.1109/ICMIT.2006.262343