DocumentCode
2961386
Title
An efficient method for parametric yield gradient estimation
Author
Wu, Ting ; Foo, Say Wei
Author_Institution
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Volume
1
fYear
1999
fDate
36342
Firstpage
419
Abstract
A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach
Keywords
Monte Carlo methods; circuit optimisation; gradient methods; integrated circuit yield; network parameters; Monte Carlo method; deterministic information; efficiency; parametric yield gradient estimation; variance; yield optimization; Circuits; Design optimization; Fluctuations; Integral equations; Manufacturing processes; Optimization methods; Probability density function; Reactive power; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-5471-0
Type
conf
DOI
10.1109/ISCAS.1999.777897
Filename
777897
Link To Document