Title :
An efficient method for parametric yield gradient estimation
Author :
Wu, Ting ; Foo, Say Wei
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach
Keywords :
Monte Carlo methods; circuit optimisation; gradient methods; integrated circuit yield; network parameters; Monte Carlo method; deterministic information; efficiency; parametric yield gradient estimation; variance; yield optimization; Circuits; Design optimization; Fluctuations; Integral equations; Manufacturing processes; Optimization methods; Probability density function; Reactive power; Yield estimation;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.777897
