• DocumentCode
    2961414
  • Title

    Improvement of moisture resistance in plastic encapsulated MOS-IC by surface finishing copper leadframe

  • Author

    Yoshioka, Osamu ; Okabe, Norio ; Nagayama, Sadao ; Yamagishi, Ryozo ; Murakami, G.

  • Author_Institution
    Hitachi Cable Ltd., Ibaraki, Japan
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    464
  • Lastpage
    471
  • Abstract
    In recent years, the demand for copper alloy lead-frame materials has been rising. This is due to deterioration of the reliability of plastic-encapsulated ICs because of larger chip size and increased heat generation from more densely integrated chips. However, copper alloys may form a thick, brittle oxide film on the surface as a result of heating during packaging, thus reducing moisture resistance. The surface finishing process for copper alloy lead-frame materials was studied to overcome this problem. It became evident that the improvement of adhesion to resin is effective in preventing the penetration of moisture into the package. This resulted in the development of an Sn-Ni-plated copper lead frame that enhances the moisture resistance
  • Keywords
    MOS integrated circuits; encapsulation; moisture measurement; MOS-IC; Sn-Ni; adhesion; chip size; heat generation; moisture resistance; plastic encapsulated; surface finishing copper leadframe; surface finishing process; Adhesives; Copper alloys; Lead; Moisture; Packaging; Plastics; Resins; Resistance heating; Surface finishing; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77790
  • Filename
    77790