Title :
A broadband technique for one-port VNA calibration and characterization of low-loss two-ports
Author_Institution :
Warsaw Univ. of Technol., Poland
Abstract :
A broadband versatile technique for precision one-port calibration of VNA is presented. It is an extension of a previous sliding short method, but accommodating a broader class of calibration devices, such as delayed short and open circuits. It features a high measurement redundancy that allows the delays and losses of these devices to be determined during the calibration. The new method is suitable for measurement of low-loss two-ports.
Keywords :
calibration; loss measurement; measurement uncertainty; network analysers; redundancy; reflectometers; swept-frequency reflectometry; two-port networks; adapter efficiency; attenuation constant; broadband technique; calibration technique; delayed short; high accuracy; high measurement redundancy; least squares fitting; low-loss two-ports; one-port vector network analyser; open circuits; overdetermined technique; reflection coefficient transformation; sliding short method; uncertainty; Calibration; Circuits; Delay; Loss measurement; Measurement uncertainty; Power measurement; Redundancy; Reflection; Spirals; Tuners;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699988
