• DocumentCode
    2961609
  • Title

    Organizational and Individual Innovation Practices in Industrial Research

  • Author

    Katragadd, Gopichand

  • Author_Institution
    John F. Welch Technol. Center, Bangalore
  • Volume
    2
  • fYear
    2006
  • fDate
    21-23 June 2006
  • Firstpage
    999
  • Lastpage
    1003
  • Abstract
    This paper discusses organizational approaches to developing a strategy and a culture tuned to innovation. Barriers to innovation, and best practices to overcome the barriers are studied. Organizational processes to manage innovation with case studies for creating an idea-rich environment are presented. Additionally, the paper presents a model covering three aspects of individual innovation - create with freedom, nurture with passion, and transcend with detachment. Individual qualities and innovation tools applied to the three aspects are presented. The John F. Welch Technology Center, Bangalore, India, is an integrated technology development center, housing GE´s Global Research as well as the engineering divisions for GE´s Industrial, Infrastructure, and Healthcare businesses. One specific JFWTC lab is tracked on its innovation growth path to demonstrate the application of the tools and models presented in this paper
  • Keywords
    industrial property; innovation management; organisational aspects; strategic planning; technology management; Bangalore; GE; Global Research; India; John F. Welch Technology Center; engineering division; healthcare business; industrial business; industrial research; infrastructure business; innovation management; integrated technology development center; intellectual property; organizational approaches; strategy planning; Acceleration; Best practices; Environmental management; Globalization; Innovation management; Inspection; Medical services; Online Communities/Technical Collaboration; Technological innovation; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Innovation and Technology, 2006 IEEE International Conference on
  • Conference_Location
    Singapore, China
  • Print_ISBN
    1-4244-0147-X
  • Electronic_ISBN
    1-4244-0148-8
  • Type

    conf

  • DOI
    10.1109/ICMIT.2006.262372
  • Filename
    4037170