A 22mW 227Msps 11b self-tuning ADC based on time-to-digital conversion

Author

Huang, Huihua ; Sechen, Carl

Author_Institution

Electr. Eng. Dept., Univ. of Texas at Dallas, Richardson, TX, USA

fYear

2009

fDate

4-5 Oct. 2009

Firstpage

1

Lastpage

4

Abstract

A 227 Msps 11b self-tuning analog-to-digital converter (ADC) based on time-to-digital conversion is presented. Sampled analog voltages are first converted to time by means of a voltage-to-time converter (VTC). Then a time-to-digital converter (TDC) converts the time to a digital signal. All the major blocks are self-tuned to address process, voltage and temperature (PVT) variations. The proposed ADC is implemented in the IBM 0.13 μm digital CMOS process and consumes 22 mW at 227 Msps, corresponding to 47 fJ/bit.

Keywords

CMOS integrated circuits; analogue-digital conversion; CMOS process; IBM; TDC; VTC; power 22 mW; sampled analog voltages; self-tuning ADC; self-tuning analog-to-digital converter; time-to-digital conversion; time-to-digital converter; voltage-to-time converter; Capacitors; Circuits; Clocks; Delay; Energy consumption; Sampling methods; Signal resolution; Signal sampling; Timing; Voltage; Analog-to-digital conversion (ADC); Time-to-digital converter (TDC); Voltage-to-time converter (VTC); calibration; low power;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems Workshop,(DCAS), 2009 IEEE Dallas

Conference_Location

Richardson, TX

Print_ISBN

978-1-4244-5483-9

Electronic_ISBN

978-1-4244-5484-6

Type

conf

DOI

10.1109/DCAS.2009.5505729

Filename

5505729