Title :
A 22mW 227Msps 11b self-tuning ADC based on time-to-digital conversion
Author :
Huang, Huihua ; Sechen, Carl
Author_Institution :
Electr. Eng. Dept., Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
A 227 Msps 11b self-tuning analog-to-digital converter (ADC) based on time-to-digital conversion is presented. Sampled analog voltages are first converted to time by means of a voltage-to-time converter (VTC). Then a time-to-digital converter (TDC) converts the time to a digital signal. All the major blocks are self-tuned to address process, voltage and temperature (PVT) variations. The proposed ADC is implemented in the IBM 0.13 μm digital CMOS process and consumes 22 mW at 227 Msps, corresponding to 47 fJ/bit.
Keywords :
CMOS integrated circuits; analogue-digital conversion; CMOS process; IBM; TDC; VTC; power 22 mW; sampled analog voltages; self-tuning ADC; self-tuning analog-to-digital converter; time-to-digital conversion; time-to-digital converter; voltage-to-time converter; Capacitors; Circuits; Clocks; Delay; Energy consumption; Sampling methods; Signal resolution; Signal sampling; Timing; Voltage; Analog-to-digital conversion (ADC); Time-to-digital converter (TDC); Voltage-to-time converter (VTC); calibration; low power;
Conference_Titel :
Circuits and Systems Workshop,(DCAS), 2009 IEEE Dallas
Conference_Location :
Richardson, TX
Print_ISBN :
978-1-4244-5483-9
Electronic_ISBN :
978-1-4244-5484-6
DOI :
10.1109/DCAS.2009.5505729
