Title :
Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
Author :
Jeffery, A. ; Lee, L.H. ; Shields, J.Q.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.
Keywords :
capacitance measurement; capacitors; electrodes; measurement standards; measurement uncertainty; units (measurement); NIST calculable capacitor; SI unit; US capacitance unit; blocking electrode; capacitance standard; cross-capacitor; eccentricity effect; geometrical imperfections effect; local imperfections; model calculable capacitor; model tests; relative standard uncertainty; tilt effect; uniform taper; Bars; Capacitance; Capacitors; Electrodes; Length measurement; NIST; Position measurement; Probes; Solid modeling; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700000
