DocumentCode :
2961857
Title :
Improving face recognition with a quality-based probabilistic framework
Author :
Ozay, Necmiye ; Yan Tong ; Wheeler, Frederick W ; Xiaoming Liu
Author_Institution :
ECE Dept., Northeastern Univ., Boston, MA, USA
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
134
Lastpage :
141
Abstract :
This paper addresses the problem of developing facial image quality metrics that are predictive of the performance of existing biometric matching algorithms and incorporating the quality estimates into the recognition decision process to improve overall performance. The first task we consider is the separation of probe/gallery qualities since the match score depends on both. Given a set of training images of the same individual, we find the match scores between all possible probe/gallery image pairs. Then, we define symmetric normalized match score for any pair, model it as the average of the qualities of probe/gallery corrupted by additive noise, and estimate the quality values such that the noise is minimized. To utilize quality in the decision process, we employ a Bayesian network to model the relationships among qualities, predefined quality related image features and recognition. The recognition decision is made by probabilistic inference via this model. We illustrate with various face verification experiments that incorporating quality into the decision process can improve the performance significantly.
Keywords :
Bayes methods; biometrics (access control); face recognition; image matching; probability; Bayesian network; biometric matching; face recognition; face verification; facial image quality metrics; image features; image recognition; probabilistic inference; quality-based probabilistic framework; Additive noise; Biometrics; Computer vision; Face recognition; Image quality; Image recognition; Prediction algorithms; Probes; Quality assessment; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops, 2009. CVPR Workshops 2009. IEEE Computer Society Conference on
Conference_Location :
Miami, FL
ISSN :
2160-7508
Print_ISBN :
978-1-4244-3994-2
Type :
conf
DOI :
10.1109/CVPRW.2009.5204299
Filename :
5204299
Link To Document :
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