Digitally assisted Analog Compressive Sensing

Analog Compressive Sensing (CS) provides a novel strategy to sample and process wideband sparse signals at sub-Nyquist rate. This scheme exploits the signal sparsity to reduce the sampling rate requirements. The analog compressive sensing system performance is greatly impacted by the accuracy of analog circuit components, especially with the scaling of CMOS technology. In this paper, the effect of the circuit imperfections in the analog compressive sensing architecture based on Parallel Segmented Compressive Sensing (PSCS) is discussed, such as the finite settling time, the timing uncertainty and so on. An iterative background calibration algorithm based on LMS (Least Mean Square) is proposed, which is shown to be able to effectively calibrate the error due to the circuit nonideal factors.