• DocumentCode
    2961997
  • Title

    A self-reference read scheme for a 1T/1C FeRAM

  • Author

    Yamada, J. ; Miwa, T. ; Koike, H. ; Toyoshima, H.

  • Author_Institution
    Silicon Syst. Res. Labs., NEC Corp., Kanagawa, Japan
  • fYear
    1998
  • fDate
    11-13 June 1998
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    This paper describes a self-reference read scheme for use with 1T/1C FeRAMs. It is able to overcome the reference voltage problem faced by conventional 1T/1C FeRAMs without the use of any reference cells. The proposed scheme employs a memory cell that is accessed twice, and it uses this cell to generate a reference voltage. This self-generated reference voltage is automatically kept between read bit line voltages, which correspond to stored data ("1" and "0"). We have designed and fabricated a test device, and confirmed the viability of the read scheme.
  • Keywords
    cellular arrays; ferroelectric storage; integrated memory circuits; random-access storage; 1T/1C FeRAM; ferroelectric memories; memory cell; one-transistor one-capacitor cell; read bit line voltages; reference voltage problem; self-generated reference voltage; self-reference read scheme; viability; Capacitors; Circuits; Fatigue; Ferroelectric films; Ferroelectric materials; National electric code; Nonvolatile memory; Parasitic capacitance; Random access memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-4766-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.1998.688099
  • Filename
    688099