DocumentCode
2961997
Title
A self-reference read scheme for a 1T/1C FeRAM
Author
Yamada, J. ; Miwa, T. ; Koike, H. ; Toyoshima, H.
Author_Institution
Silicon Syst. Res. Labs., NEC Corp., Kanagawa, Japan
fYear
1998
fDate
11-13 June 1998
Firstpage
238
Lastpage
241
Abstract
This paper describes a self-reference read scheme for use with 1T/1C FeRAMs. It is able to overcome the reference voltage problem faced by conventional 1T/1C FeRAMs without the use of any reference cells. The proposed scheme employs a memory cell that is accessed twice, and it uses this cell to generate a reference voltage. This self-generated reference voltage is automatically kept between read bit line voltages, which correspond to stored data ("1" and "0"). We have designed and fabricated a test device, and confirmed the viability of the read scheme.
Keywords
cellular arrays; ferroelectric storage; integrated memory circuits; random-access storage; 1T/1C FeRAM; ferroelectric memories; memory cell; one-transistor one-capacitor cell; read bit line voltages; reference voltage problem; self-generated reference voltage; self-reference read scheme; viability; Capacitors; Circuits; Fatigue; Ferroelectric films; Ferroelectric materials; National electric code; Nonvolatile memory; Parasitic capacitance; Random access memory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-4766-8
Type
conf
DOI
10.1109/VLSIC.1998.688099
Filename
688099
Link To Document