DocumentCode
2962081
Title
A compact high voltage vector inversion generator
Author
Engel, T.G. ; Kristiansen, M.
Author_Institution
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Volume
2
fYear
1995
fDate
3-6 July 1995
Firstpage
1389
Abstract
The Pichugin pulser (named after its Russian inventor) is a compact, high reliability vector inversion generator. Although consisting of many stages, the Pichugin pulser has the distinct advantage that only one inversion switch is required. One-switch operation gives the generator its high degree of reliability and is accomplished by using transformer coupling between the generator stages. If efficient transformer coupling is maintained, the generator can be made very compact. This investigation reports on the design, performance, and characterization of a compact 500 kV, approximately 1 J Pichugin pulser. Without an output peaking switch (or spark gap) the output risetime of the pulser is approximately 0.5 /spl mu/s. Shorter, nanosecond risetimes have been measured with the use of an output peaking switch. These types of pulsers are used in our laboratory to trigger various spark gaps and multi-channel surface discharge switches with a good performance record and a high degree of reliability. The Pichugin pulser is an attractive alternative to conventional Marx-bank pulser design.
Keywords
power supplies to apparatus; pulse generators; pulsed power switches; pulsed power technology; reliability; surface discharges; 0.5 mus; 1 J; 500 kV; Pichugin pulser; compact high voltage vector inversion generator; high reliability vector inversion generator; multi-channel surface discharge switches; nanosecond risetimes; output peaking switch; output risetime; spark gaps triggering; transformer coupling; Capacitors; Laboratories; Power engineering and energy; Power generation; Pulse generation; Pulse transformers; Reliability engineering; Spark gaps; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
Conference_Location
Albuquerque, NM, USA
Print_ISBN
0-7803-2791-8
Type
conf
DOI
10.1109/PPC.1995.599811
Filename
599811
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