DocumentCode :
2962090
Title :
Leakage Power Minimization of Nanoscale CMOS Circuits via Non-Critical Path Transistor Sizing
Author :
Fu, Bo ; Ampadu, Paul
Author_Institution :
Rochester Univ., Rochester
fYear :
2006
fDate :
10-13 Dec. 2006
Firstpage :
1101
Lastpage :
1104
Abstract :
A leakage power minimization method in nanoscale CMOS circuits by transistor sizing in non-critical paths is presented. It is shown that a small increase in delay by transistor downsizing of non-critical paths can provide a significant reduction in leakage power. Moreover, nonlinear dependence of leakage current on width (due to inverse narrow width effects) can be exploited to minimize leakage power at non-minimum widths. A 64-bit carry-lookahead adder, with carry blocks optimized for speed and sum blocks minimized for leakage power, achieves a reduction in leakage power by about 25%.
Keywords :
CMOS logic circuits; adders; carry logic; leakage currents; low-power electronics; nanoelectronics; carry-lookahead adder; inverse narrow width effects; leakage current; leakage power minimization method; nanoscale CMOS circuits; noncritical path transistor sizing; word length 64 bit; Adders; Capacitance; Circuits; Isolation technology; Leakage current; Minimization methods; Oxidation; Power supplies; Subthreshold current; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location :
Nice
Print_ISBN :
1-4244-0395-2
Electronic_ISBN :
1-4244-0395-2
Type :
conf
DOI :
10.1109/ICECS.2006.379631
Filename :
4263563
Link To Document :
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