• DocumentCode
    2962090
  • Title

    Leakage Power Minimization of Nanoscale CMOS Circuits via Non-Critical Path Transistor Sizing

  • Author

    Fu, Bo ; Ampadu, Paul

  • Author_Institution
    Rochester Univ., Rochester
  • fYear
    2006
  • fDate
    10-13 Dec. 2006
  • Firstpage
    1101
  • Lastpage
    1104
  • Abstract
    A leakage power minimization method in nanoscale CMOS circuits by transistor sizing in non-critical paths is presented. It is shown that a small increase in delay by transistor downsizing of non-critical paths can provide a significant reduction in leakage power. Moreover, nonlinear dependence of leakage current on width (due to inverse narrow width effects) can be exploited to minimize leakage power at non-minimum widths. A 64-bit carry-lookahead adder, with carry blocks optimized for speed and sum blocks minimized for leakage power, achieves a reduction in leakage power by about 25%.
  • Keywords
    CMOS logic circuits; adders; carry logic; leakage currents; low-power electronics; nanoelectronics; carry-lookahead adder; inverse narrow width effects; leakage current; leakage power minimization method; nanoscale CMOS circuits; noncritical path transistor sizing; word length 64 bit; Adders; Capacitance; Circuits; Isolation technology; Leakage current; Minimization methods; Oxidation; Power supplies; Subthreshold current; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    1-4244-0395-2
  • Electronic_ISBN
    1-4244-0395-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2006.379631
  • Filename
    4263563