Title :
An integrated diagnostics approach to embedded and flight-line support systems
Author :
Stanley, Anne M. ; Smith, James D. ; Toll, Kenneth R.
Author_Institution :
Rockwell Int. Corp., Anaheim, CA, USA
Abstract :
The current technology of expert systems affords opportunities for improved onboard and offboard diagnostic systems that are a necessity for future avionics and support systems. A proposed architecture and methodology are discussed that address the requirements for such systems. The concepts discussed include real-time expert system issues; diagnostic-system compatibility issues; and considerations for the development, testing, and fielding of such systems. The authors focus on fault detection and isolation and discuss the concepts and implementation of such a system. It is stressed that in order to achieve the goals of the USAF integrated diagnostics program, emphasis must be placed on providing consistency and compatibility and the support system that complements it
Keywords :
aircraft instrumentation; automatic test equipment; electronic engineering computing; expert systems; maintenance engineering; military computing; USAF; avionics; diagnostic systems; diagnostic-system compatibility issues; expert systems; fault detection; flight-line support systems; integrated diagnostics; real-time expert system issues; Aerospace electronics; Costs; Diagnostic expert systems; Expert systems; Humans; Missiles; Performance analysis; Personnel; System testing; Weapons;
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1989.40386
