Title :
A feasibility study of high-frequency buck regulators in nanometer CMOS technologies
Author :
Fu, Wei ; Fayed, Ayman
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
The feasibility of implementing buck converters with switching frequencies of 200MHz and beyond to reduce the size of passive components to integrate-able levels is investigated. Switching losses at such high frequencies are compared to traditional converters implemented on typical analog power technologies to demonstrate that the scaling down of CMOS technologies to nanometer levels can indeed enable switching at such high frequencies while maintaining decent efficiency. Preliminary simulation results on a typical 45nm technology are used to verify the feasibility.
Keywords :
CMOS integrated circuits; nanotechnology; power convertors; buck converter; frequency 200 MHz; high-frequency buck regulator; nanometer CMOS technology; passive component; size 45 nm; Batteries; Buck converters; CMOS technology; Capacitors; Costs; Frequency conversion; Inductors; Packaging; Power supplies; Regulators; Buck Converters; CMOS; DC-DC Converters;
Conference_Titel :
Circuits and Systems Workshop,(DCAS), 2009 IEEE Dallas
Conference_Location :
Richardson, TX
Print_ISBN :
978-1-4244-5483-9
Electronic_ISBN :
978-1-4244-5484-6
DOI :
10.1109/DCAS.2009.5505767
