DocumentCode :
2962494
Title :
Structure-performance relationship in pentacene-based thin-film transistors
Author :
Horowitz, Gilles ; Kalb, Wolfgang ; Mottaghi, Mohammad ; Lang, Philippe
Author_Institution :
ITODYS, CNRS-UMR, Paris, France
Volume :
2
fYear :
2004
fDate :
4-7 May 2004
Firstpage :
1409
Abstract :
Pentacene-based thin-film transistors were fabricated on Si:n+/alumina substrates with gold top-contact source and drain electrodes. The growth mechanism of the pentacene layer was followed by atomic force microscopy (AFM). On some devices, the alumina surface was modified with fatty acid self-assembled monolayers (SAM) prior to pentacene deposition. The first stage of the deposition was found two-dimensional on bare alumina and three-dimensional on the SAM treated substrates. This has important implications on the depth dependent mobility, as evidenced from a modeling of the current-voltage characteristics. It is found that SAM treated samples present higher performance with thick film, while the reverse is true for thin film.
Keywords :
alumina; atomic force microscopy; monolayers; organic semiconductors; self-assembly; silicon; substrates; thin film transistors; AFM; Al2O3; alumina substrates; alumina surface; atomic force microscopy; drain electrodes; fatty acid self-assembled monolayers; gold top-contact source; pentacene-based thin-film transistors; thick film; thin film; Atomic force microscopy; Atomic layer deposition; Current-voltage characteristics; Electrodes; Gold; Pentacene; Substrates; Surface treatment; Thick films; Thin film transistors; growth mechanism; organic thin-film transistors; self-assembled monolayers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2004 IEEE International Symposium on
Print_ISBN :
0-7803-8304-4
Type :
conf
DOI :
10.1109/ISIE.2004.1572019
Filename :
1572019
Link To Document :
بازگشت