• DocumentCode
    2962494
  • Title

    Structure-performance relationship in pentacene-based thin-film transistors

  • Author

    Horowitz, Gilles ; Kalb, Wolfgang ; Mottaghi, Mohammad ; Lang, Philippe

  • Author_Institution
    ITODYS, CNRS-UMR, Paris, France
  • Volume
    2
  • fYear
    2004
  • fDate
    4-7 May 2004
  • Firstpage
    1409
  • Abstract
    Pentacene-based thin-film transistors were fabricated on Si:n+/alumina substrates with gold top-contact source and drain electrodes. The growth mechanism of the pentacene layer was followed by atomic force microscopy (AFM). On some devices, the alumina surface was modified with fatty acid self-assembled monolayers (SAM) prior to pentacene deposition. The first stage of the deposition was found two-dimensional on bare alumina and three-dimensional on the SAM treated substrates. This has important implications on the depth dependent mobility, as evidenced from a modeling of the current-voltage characteristics. It is found that SAM treated samples present higher performance with thick film, while the reverse is true for thin film.
  • Keywords
    alumina; atomic force microscopy; monolayers; organic semiconductors; self-assembly; silicon; substrates; thin film transistors; AFM; Al2O3; alumina substrates; alumina surface; atomic force microscopy; drain electrodes; fatty acid self-assembled monolayers; gold top-contact source; pentacene-based thin-film transistors; thick film; thin film; Atomic force microscopy; Atomic layer deposition; Current-voltage characteristics; Electrodes; Gold; Pentacene; Substrates; Surface treatment; Thick films; Thin film transistors; growth mechanism; organic thin-film transistors; self-assembled monolayers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2004 IEEE International Symposium on
  • Print_ISBN
    0-7803-8304-4
  • Type

    conf

  • DOI
    10.1109/ISIE.2004.1572019
  • Filename
    1572019