Title :
Advanced technology ATE for fuel accessory testing
Author :
Thoman, David C. ; Hess, Larry L.
Author_Institution :
Allied-Signal Aerosp. Co., South Bend, IN, USA
Abstract :
The authors review the current state of automation and systems technologies and show how the judicious choice and integration of such technologies provides a sound platform for implementation of advanced fuel-accessory test-system concepts. Totally integrated test facilities parcel commands and share data as needed to meet throughput, reliability, and maintainability goals. Such a facility exploits advanced testing strategies (nonstatic, on-condition, and learn mode) and maintenance strategies (built-in test, expert diagnostics, and auto calibration) to accelerate testing and assure high test-station availability. Adjustment diagnostics and expert fault isolation perform nearly all decisions required for unit-under-test (UUT) calibration and fault/squawk evaluation. Interactive video/graphics provides pictorial information to aid the operator in the UUT adjustment and repair operation. These same technologies aid maintenance technicians in evaluation, calibration, and repair of the automatic test equipment (ATE). Nonproductive testing is thus minimized by the early identification of UUT and ATE faults and quick decisions on repair/reject actions required
Keywords :
aerospace computing; aerospace engines; aerospace testing; aircraft; automatic test equipment; military systems; ATE; advanced testing strategies; aircraft engines; auto calibration; automatic test equipment; built-in test; expert diagnostics; expert fault isolation; fault/squawk evaluation; fuel accessory testing; integrated test facilities; learn mode; maintenance strategies; military aircraft; nonstatic strategy; on-condition; repair operation; Acoustic testing; Automatic testing; Automation; Built-in self-test; Calibration; Fuels; Maintenance; System testing; Test facilities; Throughput;
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1989.40396