Title :
Investigation of aging effects in different implementations and structures of programmable routing resources of FPGAs
Author :
Amouri, Abdulazim ; Kiamehr, Saman ; Tahoori, Mehdi
Author_Institution :
Dept. of Dependable Nano-Comput., Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
Transistor aging mostly due to Negative and Positive Bias Temperature Instability (NBTI and PBTI) is a major reliability threat for VLSI circuits fabricated in nanometer technology nodes. As much as FPGAs benefit from the most scaled and advanced technologies, they become more susceptible to transistor aging. In this paper, we investigate the effect of transistor aging on programmable routing resources of FPGAs, by considering different implementations through detailed SPICE simulations. The effects of different parameters, such as wire length, cascaded routing, routing fan-out, signal probability and supply voltage on the aging of routing resources are studied.
Keywords :
SPICE; VLSI; field programmable gate arrays; negative bias temperature instability; transistors; FPGA; SPICE simulation; VLSI circuit; cascaded routing; nanometer technology nodes; negative bias temperature instability; positive bias temperature instability; programmable routing resources; routing fan out; signal probability; supply voltage; transistor aging effect; Aging; Delay; Field programmable gate arrays; Logic gates; Routing; Transistors; Wires;
Conference_Titel :
Field-Programmable Technology (FPT), 2012 International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-2846-3
Electronic_ISBN :
978-1-4673-2844-9
DOI :
10.1109/FPT.2012.6412136
