DocumentCode
2962720
Title
VersaPower: Power estimation for diverse FPGA architectures
Author
Goeders, J.B. ; Wilton, Steven J. E.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
fYear
2012
fDate
10-12 Dec. 2012
Firstpage
229
Lastpage
234
Abstract
This paper presents VersaPower, a tool capable of modelling the power usage of many different field programmable gate array (FPGA) architectures.The latest release of the academic FPGA CAD tool, Versatile Place and Route 6.0 (VPR), supports new architecture features such as fracturable look-up tables and complex logic blocks. Past FPGA power models do not support these new features. VersaPower is designed to work closely with VPR to provide power estimation for any architecture supported by this new CAD flow. This allows researchers to investigate the effects on power usage of both new FPGA architectures, as well as new CAD algorithms. VersaPower is designed to operate with modern CMOS technologies, and is validated against SPICE using 22 nm, 45 nm and 130 nm technologies. Results show that for common architectures, roughly 60% HDL of power consumption is due to the routing fabric, 30% from logic blocks and 10% from the clock network. Architectures ODN supporting fracturable LUTs require 5-10% more power, as each CLB has additional I/O pins, increasing the sizes of local interconnect crossbars and connection boxes.
Keywords
CMOS integrated circuits; SPICE; computer architecture; field programmable gate arrays; logic CAD; CMOS technology; HDL; SPICE; VPR; VersaPower; Versatile Place and Route 6.0; academic FPGA CAD tool; complex logic block; diverse FPGA architecture; field programmable gate array; fracturable look-up table; power consumption; power estimation; size 130 nm; size 22 nm; size 45 nm; Capacitance; Field programmable gate arrays; Multiplexing; Solid modeling; Table lookup; Transistors; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Field-Programmable Technology (FPT), 2012 International Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4673-2846-3
Electronic_ISBN
978-1-4673-2844-9
Type
conf
DOI
10.1109/FPT.2012.6412139
Filename
6412139
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