• DocumentCode
    2962743
  • Title

    Learning to segment using machine-learned penalized logistic models

  • Author

    Yong Yue ; Tagare, Hemant D.

  • Author_Institution
    Dept. of Diagnostic Radiol., Yale Univ., New Haven, CT, USA
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    58
  • Lastpage
    65
  • Abstract
    Classical maximum-a-posteriori (MAP) segmentation uses generative models for images. However, creating tractable generative models can be difficult for complex images. Moreover, generative models require auxiliary parameters to be included in the maximization, which makes the maximization more complicated. This paper proposes an alternative to the MAP approach: using a penalized logistic model to directly model the segmentation posterior. This approach has two advantages: (1) It requires fewer auxiliary parameters, and (2) it provides a standard way of incorporating powerful machine-learning methods into segmentation so that complex image phenomenon can be learned easily from a training set. The technique is used to segment cardiac ultrasound images sequences which have substantial spatio-temporal contrast variation that is cumbersome to model. Experimental results show that the method gives accurate segmentations of the endocardium in spite of the contrast variation.
  • Keywords
    image segmentation; image sequences; learning (artificial intelligence); maximum likelihood estimation; medical image processing; classical maximum-a-posteriori segmentation; complex image phenomenon; endocardium; image segmentation; machine-learned penalized logistic models; segment cardiac ultrasound images sequences; substantial spatio-temporal contrast variation; Biomedical imaging; Image generation; Image segmentation; Image sequences; Logistics; Machine learning; Medical diagnostic imaging; Myocardium; Radiology; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2009. CVPR Workshops 2009. IEEE Computer Society Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-3994-2
  • Type

    conf

  • DOI
    10.1109/CVPRW.2009.5204343
  • Filename
    5204343