Author index

fYear

1998

fDate

26-26 March 1998

Firstpage

239

Lastpage

240

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on

Conference_Location

Kanazawa, Japan

Print_ISBN

0-7803-4348-4

Type

conf

DOI

10.1109/ICMTS.1998.688104

Filename

688104

Link To Document