DocumentCode :
2963398
Title :
High resolution boundary element forward models for sensor arrays: an application to electroencephalography
Author :
Loftus, Caitlinn ; Jenkinson, Mark ; Egan, Gary F.
Author_Institution :
Howard Florey Inst., Melbourne Univ., Vic., Australia
fYear :
2004
fDate :
14-17 Dec. 2004
Firstpage :
599
Lastpage :
604
Abstract :
The forward problem of electroencephalography (EEG) involves mapping current sources in the brain to voltages at sensors (electrodes) on the scalp. Boundary element modeling is a numerical method which has been widely applied to this problem. Here, the boundary element approach is validated for spherical models for which analytic solutions can be calculated. Three aspects of the basic approach were varied: the type of potential approximation (de Munck, J.C., IEEE Trans. Biomed. Eng., vol.39, no.9, p.986-90, 1992); the use of a solid angle correction (Heller, L., Digital Image Synthesis and Inverse Optics, Proc. SPIE, vol.1351, p.376-90, 1990); the isolated skull correction (Hamalainen, M.S. and Sarvas, J., IEEE Trans. Biomed. Eng., vol.36, no.2, p.165-71, 1989). The effects of locally non-uniform meshes were also considered. The calculations were performed using six different mesh resolutions, including mesh resolutions significantly higher than those previously used for forward model evaluation.
Keywords :
approximation theory; array signal processing; boundary-elements methods; electroencephalography; medical signal processing; EEG; electroencephalography; forward problem; high resolution boundary element forward models; isolated skull correction; nonuniform meshes; potential approximation; sensor arrays; solid angle correction; spherical models; Biomedical optical imaging; Brain modeling; Digital images; Electrodes; Electroencephalography; Numerical models; Scalp; Sensor arrays; Solids; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Sensors, Sensor Networks and Information Processing Conference, 2004. Proceedings of the 2004
Print_ISBN :
0-7803-8894-1
Type :
conf
DOI :
10.1109/ISSNIP.2004.1417529
Filename :
1417529
Link To Document :
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