Title :
Voltage stability facing the rare events using a load shedding based on a two sensitivity degrees calculation
Author :
Chebbi, S. ; Jouini, H.
Author_Institution :
High Sch. of Sci. & Tech. of Tunis, Univ. of Tunis, Tunis, Tunisia
Abstract :
The electrical network stability and in particular the voltage one, facing to serious faults, represents one of the major preoccupations of electricity companies since these faults can destroy the voltage quality and even lead to a voltage collapse phenomenon. To avoid such phenomenon we proposed a curative defense method based on the load shedding and this by the use of two sensitivity model calculations. The first model consists in evaluating the load quantity to be shed in relation to the injected active power sensitivity at a bus compared to the voltage level at different network buses, while the second model is based on the voltage sensitivity compared to the reactive power at different network buses. Numerical simulations improved the efficiency of the suggested strategies.
Keywords :
load shedding; numerical analysis; electrical network stability; load shedding; numerical simulations; sensitivity degrees calculation; voltage collapse phenomenon; voltage sensitivity; voltage stability; Fluctuations; Load modeling; Reactive power; Regulators; Sensitivity; Vectors; Voltage control; Rare events; collapse phenomenon; load shedding; voltage stability;
Conference_Titel :
Electric Power and Energy Conversion Systems (EPECS), 2011 2nd International Conference on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4577-0804-6
DOI :
10.1109/EPECS.2011.6126809