• DocumentCode
    2964527
  • Title

    Clock and data recovery circuits with fast acquisition and low jitter

  • Author

    Zhang, Ruiyuan ; La Rue, George S.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    48
  • Lastpage
    51
  • Abstract
    This paper presents a half-rate clock and data recovery circuit (CDR) that combines the best features, fast acquisition and low jitter, of digital phase selection and phase-lock-loop (PLL) CDR circuits. This CDR circuit consists of a phase selector, which can lock to the data in just a few clock cycles but has high jitter, and a PLL, which requires a much longer lock time but provides a low-jitter clock after locking. Fabricated in a 0.5 μm CMOS process, the combined CDR achieves operation up to 750 Mbps. Measurements show at least a 6% acquisition range, an initial acquisition time of 8 bit times with jitter of 30% bit time, and jitter of 16 ps at 688 Mbps after a PLL lock time of 700 ns. Power dissipation is 300 mW and die area is 1.4 × 1.4 mm2.
  • Keywords
    CMOS digital integrated circuits; delay lock loops; digital phase locked loops; phase detectors; synchronisation; timing jitter; 688 Mbit/s; 750 Mbit/s; CMOS process; clock and data recovery circuit; delay-locked loops; digital phase selection circuits; fast acquisition; fast locking time; half-rate circuit; low jitter; phase frequency detector implementation; phase-locked loops; power dissipation; CMOS process; Circuits; Clocks; Computer science; Delay; Error analysis; Jitter; Phase frequency detector; Phase locked loops; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2004 IEEE Workshop on
  • Print_ISBN
    0-7803-8369-9
  • Type

    conf

  • DOI
    10.1109/WMED.2004.1297349
  • Filename
    1297349