A Research on BIT Single-Fault Threshold Value Setting Approach Based on ROC

In order to solve the problem that setting the double threshold value hypothesis question under the single breakdown in the BIT, to decrease BIT´s false alarm rate, and improve BIT´s testability. Researches were done on the subject´s quota relations between the ROC sensitivity, specificity and its FDR, FAR, and corresponding test index was got on the ROC. It was realized that more lower FAR can be obtained under certain prerequisite by using a parameter normal distribution model in the three states to simulating the actual measurement data and inputting the ROC analysis. The simulation results showed that it is valid and feasible that applies the method proposed to modify the value of BIT single failure threshold.