Title :
The Application of Template Matching Graphic Technology in LED Chip Testing
Author :
Wei, Shi ; Jianguo, Wang ; Zhanmin, Dong ; Wenxing, Zhang ; Liying, Cao
Author_Institution :
Inner Mongolia Univ. of Sci. & Technol., Baotou, China
Abstract :
A new LED chip testing system based on template matching graphic technology is developed. A LED chip is located precisely free of touch, with digital graphic disposal technology involving acquisition, orientation, segmentation of graphic, edge detection, outlines distill, and so on. The system proves to be feasible.
Keywords :
circuit analysis computing; circuit testing; edge detection; image matching; image segmentation; light emitting diodes; LED chip testing system; digital graphic disposal technology; edge detection; graphic segmentation; template matching graphic technology; Graphics; Image edge detection; Light emitting diodes; Pixel; Software; Testing; Edge Testing; Orientation; Outline; Segmentation; Template matching;
Conference_Titel :
Intelligent Computation Technology and Automation (ICICTA), 2011 International Conference on
Conference_Location :
Shenzhen, Guangdong
Print_ISBN :
978-1-61284-289-9
DOI :
10.1109/ICICTA.2011.471
