Title :
Chip to wafer temporary bonding with self-alignment by patterned FDTS layer for size-free MEMS integration
Author :
Lu, Jian ; Takagi, Hideki ; Maeda, Ryutaro
Author_Institution :
Res. Center for Ubiquitous MEMS & Micro Eng. (UMEMSME), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Abstract :
In this paper, we present a low-cost and rapid self-alignment process for temporary bonding of MEMS chip onto carrier wafer for size-free MEMS-IC integration. For the first time, a hydrophobic self-assembled monolayer (SAM), FDTS (CF3(CF2)7(CH2)2SiCl3), was successfully patterned by lift-off process on an oxidized silicon carrier wafer. Small volume of H2O (~μl/cm2) was then dropped and spread on the non-coated hydrophilic SiO2 surface for temporary bonding of MEMS chip. Our results demonstrated that the hydrophobic FDTS pattern on carrier wafer enables rapid and precise self-alignment of MEMS chip onto SiO2 binding-site by capillary force. After transfer the MEMS chips to target wafer, FDTS can be removed by O2 plasma treatment or UV irradiation.
Keywords :
elemental semiconductors; micromechanical devices; silicon; wafer bonding; FDTS layer; MEMS-IC integration; SAM; SiO2; UV irradiation; carrier wafer; chip to wafer temporary bonding; hydrophobic self-assembled monolayer; lift-off process; non-coated hydrophilic surface; plasma treatment; Bonding; Coatings; Force; Micromechanical devices; Surface morphology; Surface treatment; Wireless sensor networks;
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
Print_ISBN :
978-1-4244-9290-9
DOI :
10.1109/ICSENS.2011.6126924