• DocumentCode
    2965354
  • Title

    A two-step readout CMOS image sensor active pixel architecture

  • Author

    Tsai, Tsung-Hsun ; Hornsey, Richard

  • Author_Institution
    Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    1941
  • Lastpage
    1945
  • Abstract
    In this paper, we introduce a 5-transistor (5T) active pixel sensor (APS) structure and a specialized oscillator readout circuit. The pixel keeps a reasonable fill factor of 43% using n-well and p-sub photodiode with an area of 5 μm × 5 μm and generates a two-step signal response to the illumination. The pixel successfully extends output swing to 0.72 V. Measured pixel random noise is 2.5 mV, achieving 51 dB signal-to-noise ratio (SNR). A readout circuit is also implemented using a ring oscillator to replace the traditional design with analog-to-digital converter (ADC) circuitry. It generates frequency output and is recorded by counters to perform signal digitization. The design is implemented with an array of 32 × 92 pixels in a 0.13μm digital CMOS process and tested with a 1.25 V supply voltage.
  • Keywords
    CMOS image sensors; analogue-digital conversion; readout electronics; voltage 1.25 V; voltage 2.5 mV; CMOS image sensors; Noise; Noise measurement; Photodiodes; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6126943
  • Filename
    6126943