DocumentCode :
2965354
Title :
A two-step readout CMOS image sensor active pixel architecture
Author :
Tsai, Tsung-Hsun ; Hornsey, Richard
Author_Institution :
Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
fYear :
2011
fDate :
28-31 Oct. 2011
Firstpage :
1941
Lastpage :
1945
Abstract :
In this paper, we introduce a 5-transistor (5T) active pixel sensor (APS) structure and a specialized oscillator readout circuit. The pixel keeps a reasonable fill factor of 43% using n-well and p-sub photodiode with an area of 5 μm × 5 μm and generates a two-step signal response to the illumination. The pixel successfully extends output swing to 0.72 V. Measured pixel random noise is 2.5 mV, achieving 51 dB signal-to-noise ratio (SNR). A readout circuit is also implemented using a ring oscillator to replace the traditional design with analog-to-digital converter (ADC) circuitry. It generates frequency output and is recorded by counters to perform signal digitization. The design is implemented with an array of 32 × 92 pixels in a 0.13μm digital CMOS process and tested with a 1.25 V supply voltage.
Keywords :
CMOS image sensors; analogue-digital conversion; readout electronics; voltage 1.25 V; voltage 2.5 mV; CMOS image sensors; Noise; Noise measurement; Photodiodes; Transistors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
ISSN :
1930-0395
Print_ISBN :
978-1-4244-9290-9
Type :
conf
DOI :
10.1109/ICSENS.2011.6126943
Filename :
6126943
Link To Document :
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