DocumentCode
2965368
Title
A proposed measurement of controlled defect induction and annealing in a carbon nanotube
Author
Gannett, Will ; Begtrup, G.E. ; Zettl, Alex
Author_Institution
Dept. of Phys., Univ. of California at Berkeley, Berkeley, CA
fYear
2008
fDate
2-15 Aug. 2008
Firstpage
117
Lastpage
118
Abstract
We propose controlled creation and annealing of defects in carbon nanotubes by plasma and current application, respectively. TEM is used to map nanoparticles, which nucleate at defect sites and act as position markers.
Keywords
annealing; carbon nanotubes; crystal defects; nucleation; annealing; carbon nanotube; controlled defect induction; Annealing; Carbon nanotubes; Gold; Nanoparticles; Nanotube devices; Organic materials; Physics; Plasma devices; Plasma materials processing; Plasma measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano-Optoelectronics Workshop, 2008. i-NOW 2008. International
Conference_Location
Shonan Village
Print_ISBN
978-1-4244-2656-0
Type
conf
DOI
10.1109/INOW.2008.4634473
Filename
4634473
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