DocumentCode :
2965493
Title :
Pulsed IEC neutron generator
Author :
Gu, Yuantao ; Miley, G. ; DelMedico, S.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Volume :
2
fYear :
1995
fDate :
3-6 July 1995
Firstpage :
1500
Abstract :
Inertial electrostatic confinement (IEC) fusion confines high energy ions in a spherical potential well where convergence in a central "core" region yields a high fusion rate. When operated in steady-state, the measured D-D neutron yield for a 30 cm diameter (7.5 cm diameter grid) IEC varies linearly with current I, giving /spl sim/10/sup 6/ neutrons/sec at 15 mA and 70 kV. Theoretically the yield should scale as a power law in I at higher currents, being proportional to I/sup 2/ in a pure beam-beam fusion regime. This favorable scaling, plus the need for short neutron bursts for some applications, motivates the development of a pulsed IEC. The present pulsed circuit provides amp-level pulses with tens of ms duration, simulating a quasi-steady state operation while avoiding arcing and controlling voltage excursions. Results demonstrating that the yield /spl sim/I/sup 2/ for 15-150 mA are presented, along with an approximate perveance criterion for initial double potential well formation.
Keywords :
cathodes; fusion reactor instrumentation; neutron production; plasma inertial confinement; power supplies to apparatus; pulse generators; pulsed power technology; 15 mA; 15 to 150 mA; 30 cm; 7.5 cm; 70 kV; D-D neutron yield; approximate perveance criterion; beam-beam fusion regime; high energy ion confinement; inertial electrostatic confinement fusion; initial double potential well formation; neutron bursts; neutron generator; power law; pulsed power supply; quasi-steady state operation; spherical potential well; Convergence; Electrostatics; Fusion power generation; IEC; Inertial confinement; Neutrons; Potential well; Pulse circuits; Pulse generation; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-2791-8
Type :
conf
DOI :
10.1109/PPC.1995.599830
Filename :
599830
Link To Document :
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