DocumentCode
2965881
Title
A traceability of loss angle standards at KRISS
Author
Rae Duk Lee ; Han Jun Kim ; Semyonov, Yu.P. ; Klionsky, M.D.
Author_Institution
Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
fYear
1998
fDate
6-10 July 1998
Firstpage
504
Lastpage
505
Abstract
A traceability of the loss angle standards at low frequencies has been established at KRISS by a joint work with VNIIM. The loss angle of the related standards and bridges can be measured and calibrated in the range of from 1/spl times/10/sup -6/ rad to /spl pi//4 rad with uncertainty of from 5/spl times/10/sup -7/ to 5/spl times/10/sup -4/ at frequencies 100 Hz to 100 kHz.
Keywords
bridge circuits; calibration; capacitors; dielectric loss measurement; measurement standards; 100 Hz to 100 kHz; R-C combined standards; adjustable capacitor; bridges; calibration; hierarchical chain; loss angle standards; low frequencies; metal-film resistors; parallel-plate capacitor; standard capacitors; traceability; uncertainty; Capacitance; Capacitors; Electrical resistance measurement; Electrodes; Frequency; Goniometers; Joining processes; Loss measurement; Resistors; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.700027
Filename
700027
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