Title :
A traceability of loss angle standards at KRISS
Author :
Rae Duk Lee ; Han Jun Kim ; Semyonov, Yu.P. ; Klionsky, M.D.
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
Abstract :
A traceability of the loss angle standards at low frequencies has been established at KRISS by a joint work with VNIIM. The loss angle of the related standards and bridges can be measured and calibrated in the range of from 1/spl times/10/sup -6/ rad to /spl pi//4 rad with uncertainty of from 5/spl times/10/sup -7/ to 5/spl times/10/sup -4/ at frequencies 100 Hz to 100 kHz.
Keywords :
bridge circuits; calibration; capacitors; dielectric loss measurement; measurement standards; 100 Hz to 100 kHz; R-C combined standards; adjustable capacitor; bridges; calibration; hierarchical chain; loss angle standards; low frequencies; metal-film resistors; parallel-plate capacitor; standard capacitors; traceability; uncertainty; Capacitance; Capacitors; Electrical resistance measurement; Electrodes; Frequency; Goniometers; Joining processes; Loss measurement; Resistors; Standards development;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700027
