• DocumentCode
    2965903
  • Title

    New TCE-matched glass-ceramic multi-chip module. I. Electrical design and characterization

  • Author

    Pence, W.E. ; Krusius, J.P. ; Subrahmanyan, R. ; Li, C.-Y. ; Carrier, G. ; Francis, G.L. ; Paisley, R.J. ; Holleran, L.M.

  • Author_Institution
    Cornell Univ., Ithaca, NY, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    647
  • Lastpage
    651
  • Abstract
    A glass-ceramic multichip packaging technology for high-I/O-count, large-area silicon chips is discussed. The module substrate material is a new glass-ceramic (Corning 9641), which can be TCE (thermal coefficient of expansion) matched to silicon (3.4 p.p.m./°C). This material possesses a low dielectric constant (5.2), resulting in reduced package signal propagation delays. A 3-in, 36-chip test vehicle has been designed, fabricated, and tested to assess the electrical and thermal properties of the glass-ceramic and its usefulness in packaging applications. Chip and module sizes equal to or greater than 1 cm and 3 in, respectively, are targets for this packaging technology, referred to as the hybrid systems module (HSM). The electrical design and characterization of the HSM test vehicle are described
  • Keywords
    ceramics; glass; hybrid integrated circuits; integrated circuit testing; modules; packaging; thermal expansion; 1 cm; 3 in; Corning 9641; TCE-matched; delay reduction; electrical characterisation; electrical design; glass-ceramic multi-chip module; high-I/O-count; hybrid systems module; large area Si chips; low dielectric constant; multichip packaging technology; package signal propagation delays; substrate material; thermal coefficient of expansion; thermal properties; Ceramics; Dielectric materials; Materials testing; Packaging; Silicon; Space technology; Thermal expansion; Thermal stresses; Transmission line measurements; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77819
  • Filename
    77819