DocumentCode :
2966017
Title :
New TCE-matched glass-ceramic multi-chip module. II. Materials, mechanical, and thermal aspects
Author :
Carrier, G. ; Francis, G.L. ; Paisley, R.J. ; Subrahmanyan, R. ; Li, C.-Y. ; Pence, W.E. ; Krusius, J.P. ; Holleran, L.M.
Author_Institution :
Corning Glass Works, Corning, NY, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
652
Lastpage :
655
Abstract :
For pt.I see ibid., p.647-51 (1989). A glass-ceramic multichip packaging technology is discussed. The module substrate material is a glass-ceramic (Corning 9641), which can be TCE (thermal coefficient of expansion) matched to silicon (3.4 p.p.m./°C) and possesses a low dielectric constant (5.2). The 9641 substrate permits large-area silicon chips (~1 cm×1 cm) to be mounted using flip-chip techniques. Multilayer metallization (Au) layers in the substrate are screen printed, and the laminated assembly is cofired to produce a 3-in, 36-chip test module. Silicon test chips 1-cm square with 81 I/Os are mounted by flip-chip bonding (95/5 Pb-Sn). Chip and module sizes equal to or greater than 1 cm and 3 in, respectively, are targets for this technology, referred to as the hybrid systems module (HSM). Significant improvement in solder joint reliability permits larger chips to be mounted on the module without degradation in the mean time to failure of the solder joints. Processing, materials, and thermal characterization data are presented
Keywords :
ceramics; circuit reliability; flip-chip devices; glass; hybrid integrated circuits; integrated circuit technology; modules; packaging; thermal expansion; 3 in; Au; Corning 9641; PbSn; TCE-matched; cofiring; flip-chip bonding; glass-ceramic multi-chip module; hybrid systems module; laminated assembly; large area Si chips; low dielectric constant; mean time to failure; multichip packaging technology; multilayer metallisation; screen printed layers; solder joint reliability; substrate material; thermal characterization data; thermal coefficient of expansion; Dielectric constant; Dielectric materials; Dielectric substrates; Metallization; Nonhomogeneous media; Packaging; Silicon; Soldering; Testing; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77820
Filename :
77820
Link To Document :
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