Title :
Efficient reduced-order modeling for the transient simulation of three-dimensional interconnect
Author :
Chou, Mary ; White, J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
Multipole-accelerated surface-volume methods have proved to be very efficient techniques for delay and cross-talk simulation of three-dimensional integrated circuit interconnect. However, to be efficiently combined with transistor circuitry in a SPICE-level simulation, reduced-order models which have accurate low-frequency behavior must be constructed. Asymptotic Waveform Evaluation (AWE) or Pade-via-Lanczos (PVL) algorithms can not be used directly to construct the reduced-order models from the surface-volume formulation, because the formulation generates dense matrices which are too expensive to factor. In this paper we describe a two-level approach to efficiently generating reduced-order models with accurate low frequency behavior. First, reduced-order models which match Taylor series terms at s=/spl infin/ are efficiently generated from the surface-volume formulation using an Arnoldi method, and then these fairly high-order models are used to efficiently construct lower-order models which snatch Taylor series terms at s=0. Examples are given to demonstrate the accuracy of the resultant low-order model.
Keywords :
circuit analysis computing; integrated circuit interconnections; series (mathematics); transient analysis; Arnoldi method; SPICE-level simulation; Taylor series terms; integrated circuit interconnect; reduced-order modeling; reduced-order models; surface-volume methods; three-dimensional interconnect; transient simulation; Circuit simulation; Conductors; Frequency; Integrated circuit interconnections; Integrated circuit technology; Jacobian matrices; Laplace equations; Linear systems; Reduced order systems; Taylor series;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.479988