DocumentCode :
2966439
Title :
Schottky Contact RF MEMS Switch Characterization
Author :
Pillans, Brandon ; Morris, Frank ; Chahal, Prem ; Frazier, Gary ; Lee, Jeong-Bong
Author_Institution :
Raytheon Co., Dallas
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
379
Lastpage :
382
Abstract :
This paper presents measured results for a novel Schottky barrier contact-based RF MEMS switch, specifically S-parameter and IP2 linearity measurements. The Schottky barrier contact allows one to operate the RF MEMS switch in a traditional capacitive mode when it is reverse biased, but can also conduct current in a forward biased state to discharge trapped charges. This configuration improves reliability, but increases insertion loss. This work intimately combines MEMS processing with solid-state electronics to produce a truly unique RF device. To the author´s knowledge, nothing similar to this work has ever been reported.
Keywords :
Schottky barriers; microswitches; microwave switches; RF MEMS switch; S-parameter; Schottky barrier contact; solid-state electronics; Contacts; Electron traps; Insertion loss; Linearity; Micromechanical devices; Radiofrequency microelectromechanical systems; Scattering parameters; Schottky barriers; Solid state circuits; Switches; Dielectric breakdown; RF MEMS; Schottky barriers; Schottky diodes; intermodulation distortion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380450
Filename :
4263827
Link To Document :
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