• DocumentCode
    2966768
  • Title

    Low-Loss Low-Cost All-Silicon CMOS NLTLs for Pulse Compression

  • Author

    Li, Ming ; Amaya, Rony E. ; Duchamp, Jean-Marc ; Ferrari, Philippe ; Harrison, Robert G. ; Tarr, N. Garry

  • Author_Institution
    Carleton Univ., Ottawa
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    This paper discusses the design of all-silicon pulse-compression nonlinear transmission lines (NLTLs), using a standard 0.18-mum CMOS process. Two different types of varactors based on NMOS transistors are investigated. One type is used in a single-edge, the other in a double-edge pulse-sharpener NLTL. To reduce the loss caused by conductive silicon substrate, a slow-wave transmission line technique is used. A measured S21 loss of only 0.25 dB/mm at 40 GHz is achieved. Both NMOS varactor and slow-wave coplanar-waveguide (CPW) transmission-line components for use in NLTL designs were fabricated and on-chip measurements were made. Transient simulations based on the measurements show a leading edge rise time reduction of 75% for single-edge, and 60% for double-edge pulse sharpening.
  • Keywords
    CMOS integrated circuits; MIMIC; MOSFET; coplanar transmission lines; coplanar waveguide components; pulse compression; transient analysis; varactors; CPW transmission-line components; NMOS transistors; all-silicon CMOS NLTL; conductive silicon substrate; double-edge pulse sharpening; frequency 40 GHz; nonlinear transmission line; on-chip measurements; pulse compression; size 0.18 mum; slow-wave coplanar-waveguide; transient simulation; varactors; CMOS process; Coplanar transmission lines; MOSFETs; Propagation losses; Pulse compression methods; Pulse measurements; Silicon; Transmission line measurements; Transmission lines; Varactors; All silicon; CMOS varactor; NLTL; NMOS varactor; pulse compression; slow-wave CPW;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380485
  • Filename
    4263846