• DocumentCode
    2967398
  • Title

    DC and Large-Signal Microwave MOSFET Model Applicable to Partially-Depleted, Body-Contacted SOI Technology

  • Author

    Burke, Darren R. ; El Kaamouchi, Majid ; Vanhoenacker-Janvier, Danielle ; Brazil, Thomas J.

  • Author_Institution
    Univ. Coll. Dublin, Dublin
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    585
  • Lastpage
    588
  • Abstract
    A new compact DC and large-signal physics-based non-quasi-static (NQS) MOSFET model is proposed, suitable for partially-depleted body-tied silicon-on-insulator (SOI) MOSFETs. The developed four-terminal nonlinear model is comprised solely of fully-continuous explicit expressions that allow for quick simulation times and accurate intermodulation distortion analysis. Nonlinear depletion capacitances, as well as short-channel effects such as drain-induced barrier lowering, have been included, while the self-heating effects of SOI MOSFETs are modeled using a first-order thermal RC circuit. NQS distributed channel behaviour is accounted for by using a segmented channel model allowing the model in principle to operate up to high mm-wave frequencies. The model is verified for DC and large signal one-/multi-tone operation as well as through WCDMA measurements.
  • Keywords
    MOSFET; RC circuits; intermodulation distortion; microwave field effect transistors; semiconductor device models; silicon-on-insulator; WCDMA measurements; body-contacted SOI technology; drain-induced barrier lowering; first-order thermal RC circuit; four-terminal nonlinear model; intermodulation distortion analysis; microwave MOSFET model; nonlinear depletion capacitances; segmented channel model; self-heating effects; short-channel effects; silicon-on-insulator MOSFET; CMOS technology; Capacitance; Circuit simulation; Intermodulation distortion; MOSFET circuits; Microwave technology; Radio frequency; Semiconductor device modeling; Silicon on insulator technology; Voltage; Compact model; large-signal; nonlinear; silicon-on-insulator (SOI) MOSFETs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380558
  • Filename
    4263883