Title :
Comparative performances of 460 MHz low-loss SAW ring and dual-track image impedance connected filters
Author :
Dobershtein, S.A. ; Malyukhov, V.A.
Author_Institution :
ONIIP, Omsk, Russia
Abstract :
In this paper we compare two types of 460 MHz low-loss SAW filters on 128°YX LiNbO3. The first construction is a dual-track image impedance connected (IIC) filter. The second construction is a ring filter using reflective multistrip couplers (RMSCs). Both filters are developed for self-matching condition when filter specified real input/output impedances are achieved by IDT static capacitance compensation with radiation susceptance. At 50 ohm the dual-track IIC filter had insertion loss of 1.5 dB, 1 dB bandwidth of 2.1 MHz and stopband attenuation about 60 dB at ±60 MHz offset from the center frequency. At 50 ohm the ring filter has shown insertion loss of 1 dB, 1 dB bandwidth of 6 MHz, stopband attenuation over 50 dB at ±60 MHz offset from the center frequency. The ring filter with phase weighted IDTs has shown insertion losses of about 2 dB, stopband attenuation over 50 dB at ±20 MHz offset from the center frequency. The phase weighted dual-track IIC filter provided insertion loss of 3.5 dB. The cascade of two unweighted ring filters has shown stopband attenuation about 90 dB and insertion losses below 3 dB. When the cascaded dual-track IIC filters are used, such stopband attenuation is provided but with greater insertion losses of 3-4 dB
Keywords :
UHF filters; capacitance; compensation; frequency response; interdigital transducers; losses; surface acoustic wave filters; 1 to 4 dB; 1.5 dB; 128°YX LiNbO3; 2.1 MHz; 460 MHz; 6 MHz; IDT static capacitance compensation; LiNbO3; SAW dual-track filters; SAW ring filters; UHF; image impedance connected filters; insertion loss; low-loss SAW filters; reflective multistrip couplers; self-matching condition; Attenuation; Bandwidth; Capacitance; Frequency; Impedance; Insertion loss; Matched filters; Propagation losses; SAW filters; Surface acoustic waves;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495545